Integrated Circuit Test Engineering: Modern Techniques

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Nearly 60 years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits.

ABOUT THE AUTHOR Ian A Grout

Dr. Ian A. Grout is a lecturer within the Department of Electronic and Computer Engineering at the University of Limerick, Ireland. He was born in London, UK in 1967, and earned his Ph.D. from Lancaster University in 1994. He has worked within the microelectronics field for several years, in particular Integrated Circuit test research and education. He has been a lecturer at Limerick since 1998.

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Bibliographic information

Title
Integrated Circuit Test Engineering: Modern Techniques
Author
Edition
1st ed.
Publisher
ISBN
9788184890297
Length
392p.
Subjects